2013年7月15日 星期一

Embedded computer memory base detection

Standards for XR-DIMM and ECC SODIMM have also contributed to advancing a ready supply of rugged memory products. Furthermore, designers have access to underfill side retainer clips and conformal coating manufacturing options along with advanced testing methodologies to help ensure robust embedded computer designs. The challenges to maintain the highest reliability and availability in rugged embedded system designs will continue, but embedded computer memory module advancements are set to keep pace with these requirements, helping enable OEMs’ continued competitiveness and future innovation.